Study of thin bismuth-based films using terahertz time-domain polarimetry

Autor:	Natallya S. Kablukova, Mikhail G. Novoselov, Elena S. Makarova, Dmitry V. Zykov, Anna V. Kuzikova, Mikhail K. Khodzitsky, A. V. Vozianova
Rok vydání:	2020
Předmět:	Permittivity Materials science Terahertz radiation business.industry Astrophysics::Instrumentation and Methods for Astrophysics Polarimetry Physics::Optics chemistry.chemical_element Polarization (waves) Electromagnetic radiation Bismuth Azimuth Optics chemistry Time domain business
Zdroj:	Infrared, Millimeter-Wave, and Terahertz Technologies VII.
DOI:	10.1117/12.2575393
Popis:	Recent years, polarimetry in the terahertz frequency range has gained popularity. Polarimetry is a technique used to measure the polarization state of electromagnetic waves transmitted through samples. The ellipticity angle, the azimuth rotation angle, complex optical properties of materials can be obtained by terahertz timedomain polarimetry. This allows for obtaining more comprehensive information about the object. In this paper, we study diagonal and off-diagonal components of the permittivity tensor of thin bismuth-based films using terahertz time-domain polarimetry
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::8c38e26579cf08def8cee75ebc476184 https://doi.org/10.1117/12.2575393 Zobrazit plný text záznamu