Optical frequency domain reflectometry for aerospace applications

Autor: Osgar John Ohanian, Emily H. Templeton, Matthew A. Davis, Dan Kominski, James W. Jeans, Naman Garg, J. R. Pedrazzani, Stephen T. Kreger, Matthew A. Castellucci, Nur Aida Abdul Rahim, Noah Beaty
Rok vydání: 2017
Předmět:
Zdroj: SPIE Proceedings.
ISSN: 0277-786X
DOI: 10.1117/12.2262845
Popis: Optical Frequency Domain Reflectometry (OFDR) is the basis of an emerging high-definition distributed fiber optic sensing (HD-FOS) technique that provides an unprecedented combination of resolution and sensitivity. We examine aerospace applications that benefit from HD-FOS, such as for defect detection, FEA model verification, and structural health monitoring. We describe how HD-FOS is used in applications spanning the full design chain, review progress with sensor response calibration and certification, and examine the challenges of data management through the use of event triggering, synchronizing data acquisition with control signals, and integrating the data output with established industry protocols and acquisition systems.
Databáze: OpenAIRE