Raman spectroscopy analysis of number of layers in mass-produced graphene flakes
| Autor: | Luiz Gustavo Cançado, Jerônimo Nunes Rocha, Eder M. Soares, Ado Jorio, Douglas R. Miquita, Cassiano Rabelo, Thales F. D. Fernandes, João Luiz Elias Campos, Omar P. Vilela Neto, Diego L. Silva, Hudson Miranda, Lucas R.P. Machado |
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| Rok vydání: | 2020 |
| Předmět: |
Coupling
Materials science Graphene business.industry Stacking 02 engineering and technology General Chemistry 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences Exfoliation joint 0104 chemical sciences law.invention symbols.namesake law G band Principal component analysis symbols Optoelectronics General Materials Science Graphite 0210 nano-technology business Raman spectroscopy |
| Zdroj: | Carbon. 161:181-189 |
| ISSN: | 0008-6223 |
| Popis: | A metrological framework for statistical analysis of number of layers and stacking order in mass-produced graphene using Raman spectroscopy is presented. The method is based on two complementary protocols, denominated by 2D and G. The 2D–protocol is based on the parameterized principal component analysis of the two-phonon 2D band, and it measures interlayer coupling. A neural-network algorithm for spectral denoising was also developed to improve the outcome. The G–protocol explores the intensity of the bond-stretching G band, and provides information about the number of layers. The method is suitable for automated statistical analysis of heterogeneous graphene-based systems with relatively low computational cost, as shown here for graphene flakes prepared by the liquid-phase exfoliation of graphite. |
| Databáze: | OpenAIRE |
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