| Autor: | Eugene A. Katz, Alexander I. Shames, David Faiman, S. M. Tuladhar, S. Shtutina |
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| Rok vydání: | 2001 |
| Předmět: |
Materials science
Condensed matter physics Conductivity Condensed Matter Physics Electronic Optical and Magnetic Materials law.invention Condensed Matter::Materials Science law Impurity Condensed Matter::Superconductivity Physics::Atomic and Molecular Clusters Grain boundary diffusion coefficient General Materials Science Grain boundary Crystallite Thin film Diffusion (business) Electron paramagnetic resonance |
| Zdroj: | Interface Science. 9:331-335 |
| ISSN: | 0927-7056 |
| Popis: | This paper focuses on the effect of grain boundaries on the diffusion processes in polycrystalline C60 thin films. Electrically induced diffusion of Au was investigated by in situ measurements of the film conductivity. Electron Paramagnetic Resonance (EPR) spectroscopy was used to study diffusion of oxygen. Increase in grain sizes in polycrystalline C60 thin films was found to result in the acceleration of gold and oxygen diffusion. The results are interpreted assuming that these impurities diffuse in C60 films dominantly along grain boundaries. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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