Special Session: A Quality and Reliability Driven DFT and DFR Strategy for Automotive and Industrial Markets
| Autor: | Scott Martin, Subhadeep Ghosh, Malav Shah |
|---|---|
| Rok vydání: | 2019 |
| Předmět: |
business.industry
Computer science Design for testing media_common.quotation_subject Automotive industry 02 engineering and technology Session (web analytics) 020202 computer hardware & architecture Reliability engineering 0202 electrical engineering electronic engineering information engineering Quality (business) business Reliability (statistics) media_common |
| Zdroj: | VTS |
| Popis: | The semiconductor market continues to evolve from consumer-based markets to automotive and industrial markets requiring higher quality and higher reliability; passing qualification and continuous improvement (CIP) is the traditional quality / reliability strategy in today's consumer-driven markets. However, to ensure acceptance in designing high value buildings, factories, and automobiles with increased semiconductor content, passing qualification and CIP is insufficient to guarantee a device meets adequate quality and reliability (QR) goals. These applications are driving the new DFT (design for test) technologies within the designs for achieving higher coverage with reduced test cost. With increased focus, suppliers must actively integrate QR into devices. Unfortunately, there aren't clear strategies or guidance. To this end, we propose quantified market-driven DPPM (defective parts per million) and product-level FIT (Failure in time) targets and show how DFT and design for reliability (DFR) can be used as part of an integrated strategy to enable product-level QR. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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