Measurement of surface contamination using oxygen‐ion‐induced x rays
Autor: | C.A. Ludemann, A. van der Woude, M.J. Saltmarsh |
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Rok vydání: | 1972 |
Předmět: | |
Zdroj: | Applied Physics Letters. 21:64-67 |
ISSN: | 1077-3118 0003-6951 |
Popis: | X rays induced by 20‐MeV oxygen ions have been used to search for trace quantities of lanthanum on the surface of a NaCl crystal. The results demonstrate the sensitivity of the method to small quantities of heavy elements present on low‐Z matrices. |
Databáze: | OpenAIRE |
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