Measurement of surface contamination using oxygen‐ion‐induced x rays

Autor:	C.A. Ludemann, A. van der Woude, M.J. Saltmarsh
Rok vydání:	1972
Předmět:	Surface (mathematics) Crystal Condensed Matter::Materials Science Physics and Astronomy (miscellaneous) Trace Amounts Chemistry Inorganic chemistry Lanthanum Oxygen ions chemistry.chemical_element Contamination
Zdroj:	Applied Physics Letters. 21:64-67
ISSN:	1077-3118 0003-6951
Popis:	X rays induced by 20‐MeV oxygen ions have been used to search for trace quantities of lanthanum on the surface of a NaCl crystal. The results demonstrate the sensitivity of the method to small quantities of heavy elements present on low‐Z matrices.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::8beda4dc580697a2fb48a28d10b61d7c https://doi.org/10.1063/1.1654281 Zobrazit plný text záznamu