Secondary ion mass spectrometry, SIMS III, Proceedings of the Third International Conference, Technical University, Budapest, Hungary, 1981. A. Benninghoven, J. Giber, J. Laszlo, M. Riedel and H. W. Werner (Editors). Springer Series in Chemical Physics, Vol. 19. Springer-Verlag, Berlin, FRG, 1982. pp. 444 + xi, 289 Figs. DM 80, US $37.00 (approx)

Autor:	John C. Vickerman
Rok vydání:	1983
Předmět:	Secondary ion mass spectrometry Philosophy Technical university Materials Chemistry Surfaces and Interfaces General Chemistry Condensed Matter Physics Engineering physics Humanities Surfaces Coatings and Films
Zdroj:	Surface and Interface Analysis. 5:IV-IV
ISSN:	1096-9918 0142-2421
DOI:	10.1002/sia.740050111
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::8bd264b601ec38c9e514767ddcd120ce https://doi.org/10.1002/sia.740050111 Zobrazit plný text záznamu Plný text