High T/sub c/ thin film and device development
Autor: | A. Cragg, J. Vrba, H. Tran, D. McKenzie, J. McCubbin, K. Betts, B. Taylor, G. Roemer, M. Tillotson, M.B. Burbank, P.R. Kubik, J. Chrzanowski, B. Heinrich, A.C.D. Chaklader, J.C. Irwin, A A Fife, S. Lee |
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Rok vydání: | 1989 |
Předmět: |
Superconductivity
Microprobe Materials science High-temperature superconductivity business.industry Scanning electron microscope Sputter deposition Electronic Optical and Magnetic Materials law.invention SQUID symbols.namesake Nuclear magnetic resonance law symbols Optoelectronics Electrical and Electronic Engineering Thin film Raman spectroscopy business |
Zdroj: | IEEE Transactions on Magnetics. 25:956-959 |
ISSN: | 0018-9464 |
Popis: | Thin films of the high-T/sub c/ superconductor YBa/sub 2/Cu/sub 3/O/sub y/ have been deposited on various substrates by diode and magnetron sputtering using bulk sintered targets. These films have been analyzed by a variety of methods: scanning electron microscopy, X-rays, electron beam microprobe, mass spectroscopy and Raman spectroscopy. The stoichiometries of the films have been measured as a function of the radial position from the center of the sputtered beam at a fixed target-substrate distance. Patterning of the films has been carried out to form planar structures such as strip lines, microbridges and RF SQUIDs (superconducting quantum interference devices). The DC current-voltage characteristics of the microbridges were measured as a function of temperature. RF SQUID behavior has been observed for single-loop devices and their properties established at 4.2 K and higher temperatures. Flux-locked noise spectra with a 1/f noise power response were recorded in the frequency range from 0.01 to approximately=100 Hz. RF SQUID signals have been observed for temperatures up to 55 K. > |
Databáze: | OpenAIRE |
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