| Autor: |
Doris L. Evans, G. R. Fischer, Hugh C. Wolfe, M. G. Graham, H. E. Hagy |
| Rok vydání: |
1972 |
| Předmět: |
|
| Zdroj: |
AIP Conference Proceedings. |
| ISSN: |
0094-243X |
| DOI: |
10.1063/1.2948579 |
| Popis: |
X‐ray diffraction data from high purity platinum, cold‐rolled to 0.13‐mm thickness, gives linear thermal expansion values in very good agreement with the optical comparator data of Austin and of Kirby and Rothrock. The intrinsically high reliability of the diffractometer method is best realized by having the sample as a ribbon heated directly by electrical conduction. High temperature recrystallization of the platinum sample while on the X‐ray unit causes growth of preferentially oriented grains having {210} lattice planes parallel to the sample surface. When a grain or single crystal having this orientation lies on the diffract ometer rotation axis, and within a rectangular area ∼ 10 × 5 mm centrally positioned in the ribbon, temperature gradients within the grain are minimized and are estimated as no more than 5°C at 1500°C. The Cu Kα radiation doublet is well resolved and used to record two independent sets of data for each temperature over a time interval of several minutes. The small discrepancies be... |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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