New Insight Into Defects and Degradation Kinetics in Lead Zirconate Titanate
| Autor: | Sven Rzepka, Karla Hiller, Daniel Monteiro Diniz Reis |
|---|---|
| Rok vydání: | 2020 |
| Předmět: |
010302 applied physics
Materials science 02 engineering and technology Orbital overlap 021001 nanoscience & nanotechnology Lead zirconate titanate 01 natural sciences Ferroelectricity Characterization (materials science) chemistry.chemical_compound chemistry Stack (abstract data type) Chemical physics Electric field 0103 physical sciences Degradation (geology) Thin film 0210 nano-technology |
| Zdroj: | 2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF). |
| DOI: | 10.1109/ifcs-isaf41089.2020.9234941 |
| Popis: | Leakage current degradation in a state-of-the-art integrated low-temperature PVD lead zirconate titanate (PZT) thin film stack is investigated over temperature and applied electric field for samples processed at three different conditions. It is demonstrated that degradation kinetics can be influenced by process conditions. Evaluation of the results provide new insight into the underlying physics and allow for further characterization of involved defects. It is proposed to interpret the change in degradation kinetics as modification of the mean hopping distance within the material. This allows to deduce the effective overlap integral of involved hopping states and marks another step towards understanding of defects in ferroelectric oxides. |
| Databáze: | OpenAIRE |
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