| Autor: |
Serap A. Savari, Narendra Chaudhary, Yao Luo |
| Rok vydání: |
2016 |
| Předmět: |
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| Zdroj: |
32nd European Mask and Lithography Conference. |
| ISSN: |
0277-786X |
| DOI: |
10.1117/12.2248449 |
| Popis: |
The pattern requirements for mask writers have steadily been growing, and there is considerable interest in multibeam mask writers to handle the throughput and resolution challenges associated with the needs of sub- 10nm technology nodes. The mask writer of the future will process terabits of information per second and deal with petabytes of data. In this paper, we investigate lossless data compression and system parallelism together to address part of the data transfer problem. We explore simple compression algorithms and the effect of parallelism on the total compressed data in a multibeam system architecture motivated by the IMS Nanofabrication multibeam mask writer series eMET. We model the shot assignment problem and beam shot overlap by means of two-dimensional linear spatial filtering on an image. We describe a fast scanning strategy and investigate data volumes for a family of beam arrays with 2 N ×(2 N −1) beams, where N is an odd integer. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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