| Autor: |
Keiji Sugi, Tomomasa Ueda, Junichi Tonotani, Tatsunori Sakano, Nobuyoshi Saito, Hisashi Kameoka, Keiko Akimoto, Isao Amemiya, Yujiro Hara, Kentaro Miura, Hajime Yamaguchi, Shintaro Nakano |
| Rok vydání: |
2011 |
| Předmět: |
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| Zdroj: |
SID Symposium Digest of Technical Papers. 42:21-24 |
| ISSN: |
0097-966X |
| Popis: |
We have reduced threshold voltage shift of IGZO TFTs processed at 200°C under bias-temperature stress of Vg = 20 V at 70°C for 2000 s to 0.22 V by optimizing IGZO deposition and annealing conditions. A flexible AMOLED display with integrated gate driver circuits has been demonstrated. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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