Measurement of mean inner potential and inelastic mean free path of ZnO nanowires and nanosheet
| Autor: | Hongbin Yu, Seungho Ahn, Martha R. McCartney, Zhaofeng Gan, David J. Smith |
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| Rok vydání: | 2015 |
| Předmět: |
Materials science
Nanostructure Polymers and Plastics business.industry Metals and Alloys Nanotechnology Chemical vapor deposition Electron Inelastic mean free path Electron holography Surfaces Coatings and Films Electronic Optical and Magnetic Materials Biomaterials Semiconductor Transmission electron microscopy Optoelectronics business Nanosheet |
| Zdroj: | Materials Research Express. 2:105003 |
| ISSN: | 2053-1591 |
| Popis: | ZnO nanowires (NWs) and ZnO nano-sheets were grown using the chemical vapor deposition method. The NW structure was characterized using transmission electron microscopy, while the mean inner potential and inelastic mean free path for 200 keV electrons were measured using off-axis electron holography to be 15.3 ± 0.2 V and 55 ± 3 nm, respectively. These values were then used to characterize the thickness of a ZnO nano-sheet, and gave consistent results. This study demonstrates that electron holography can provide useful information about nanostructured ZnO materials and devices. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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