SEM and SAM imaging of silane LB films on metallic substrates
| Autor: | Michael Wolpers, Martin Stratmann, Helmut Viefhaus |
|---|---|
| Rok vydání: | 1990 |
| Předmět: |
Langmuir
Silanes Scanning electron microscope Alloy Analytical chemistry General Physics and Astronomy Surfaces and Interfaces General Chemistry engineering.material Condensed Matter Physics Silane Surfaces Coatings and Films Metal chemistry.chemical_compound chemistry Transition metal visual_art engineering visual_art.visual_art_medium Thin film |
| Zdroj: | Applied Surface Science. 45:167-170 |
| ISSN: | 0169-4332 |
| DOI: | 10.1016/0169-4332(90)90067-a |
| Popis: | Monomolecular Langmuir-Blodgett films of silanes have been prepared on water by using a computer-controlled Langmuir balance. The LB films were transferred from the fluid to solid substrates like Fe, Cr and Ni/Cr alloy. By using scanning electron microscopy (SEM) and scanning Auger microscopy (SAM) it was shown that both methods allowed very easy identification of covered and uncovered areas of the solid substrate. Most probably a separation of the LB film occurs during transfer from the fluid to the solid substrate leading to the observed island structure of the LB films on the solids. |
| Databáze: | OpenAIRE |
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