Compact Modeling of High Frequency Correlated Noise in HBTs

Autor: Anjan Chakravorty, J. Herricht, Michael Schroter, Paulius Sakalas
Rok vydání: 2006
Předmět:
Zdroj: 2006 Bipolar/BiCMOS Circuits and Technology Meeting.
ISSN: 1088-9299
DOI: 10.1109/bipol.2006.311175
Popis: A compact model solution, consistent with the system theory for correlated base and collector shot noise sources, is derived and implemented in the bipolar transistor model HICUM using Verilog-A. Compiled (with Tiburon) Verilog-A model is simulated using ADS 2004A and the results are tested against measured noise parameters for high-frequency (fT at 150 GHz) SiGe HBTs. Very good agreement between simulated and measured data is obtained.
Databáze: OpenAIRE