An electron optical tool kit for transmission and surface electron microscopy
| Autor: | Lee H. Veneklasen |
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| Rok vydání: | 1991 |
| Předmět: | |
| Zdroj: | Proceedings, annual meeting, Electron Microscopy Society of America. 49:414-415 |
| ISSN: | 2690-1315 0424-8201 |
| Popis: | This speculative discussion is offered in memory of Prof. Ben Siegel's fascination with the science of microscope instrumentation. It views the microscope configuration as a set of tools for creating observational opportunities. The central element is a condensor/objective lens in which the specimen is immersed, and along whose axis lie conjugate image and diffraction planes. An illumination system sets up beam conditions, in mode l1, forming a parallel beam, and Mode l2 forming a probe at the center of the lens. A projection system determines the plane within the objective that is magnified onto a recording detector surface. Projection mode P1, views the plane at the lens center, while projection mode P2 views the back focal or diffraction plane behind the lens. These two lens systems, along with apertures, scan coils, and detectors establish various modes of operation which make up the microscopist “tool kit”. |
| Databáze: | OpenAIRE |
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