| Autor: |
Stéphane D'Escrivan, Jean-François Roussel, V. Viel-Inguimbert, Thomas Tondu |
| Rok vydání: |
2008 |
| Předmět: |
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| Zdroj: |
44th AIAA/ASME/SAE/ASEE Joint Propulsion Conference & Exhibit. |
| DOI: |
10.2514/6.2008-5090 |
| Popis: |
Hall Effect Thrusters have now proven their reliability as electric propulsion. But the life length for this type of thruster is limited by erosion of the thruster channel, typically BNSiO2 composite ceramics. In this paper we present BN-SiO2 sputtering yield determination by Monte Carlo simulations using the ONERA simulation code for sputtering CSiPI. We precisely explain how input parameters are chosen based only on materials thermodynamics data. This allows CSiPI to be predictive. Simulation results for BN and SiO2 ion bombardment by Xe + are presented, and a sputtering yield for composite BN-SiO2 is derived from BN and SiO2 yields. Simulations are compared with experimental measurements from literature. Good agreement is observed for normal incidences sputtering for BN and SiO2. At higher incidence, we propose and qualitatively argue the fact that sputtering yield is strongly influenced by the target roughness that is not considered by CSiPI. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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