Autor: |
M. Pauty, P. Vernier, G. Niquet, J.P. Goudonnet, G. Chabrier |
Rok vydání: |
1981 |
Předmět: |
|
Zdroj: |
Thin Solid Films. 82:89-95 |
ISSN: |
0040-6090 |
DOI: |
10.1016/0040-6090(81)90565-4 |
Popis: |
We report the first measurements of the metal electroreflectance in the MIM structures Ag/Al 2 O 3 /Au,Au/Al 2 O 3 /Ag and Al/Al 2 O 3 /Ag. The results are consistent with the data obtained from electrolytic cells by other investigators. The electroreflectance from MIM structures complements the data from electrolytic cells and can be measured over a wider temperature range; however, interference between the waves reflected at every interface must be taken into account. The interference effect in symmetric and asymmetric structures is discussed. |
Databáze: |
OpenAIRE |
Externí odkaz: |
|