Measurement of metal electroreflectance in MIM structures

Autor: M. Pauty, P. Vernier, G. Niquet, J.P. Goudonnet, G. Chabrier
Rok vydání: 1981
Předmět:
Zdroj: Thin Solid Films. 82:89-95
ISSN: 0040-6090
DOI: 10.1016/0040-6090(81)90565-4
Popis: We report the first measurements of the metal electroreflectance in the MIM structures Ag/Al 2 O 3 /Au,Au/Al 2 O 3 /Ag and Al/Al 2 O 3 /Ag. The results are consistent with the data obtained from electrolytic cells by other investigators. The electroreflectance from MIM structures complements the data from electrolytic cells and can be measured over a wider temperature range; however, interference between the waves reflected at every interface must be taken into account. The interference effect in symmetric and asymmetric structures is discussed.
Databáze: OpenAIRE