Evaluation of the holographic parameters by electrosynthesized Cd X Zn 1−X S (X=0.3) thin films using double exposure digital holographic interferometry technique
| Autor: | Prashant Chikode, N.S. Shinde, Surendra Shinde, Vijay J. Fulari, H. D. Dhaygude |
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| Rok vydání: | 2017 |
| Předmět: |
Imagination
Materials science media_common.quotation_subject Holography 02 engineering and technology Substrate (electronics) 01 natural sciences law.invention Stress (mechanics) Optics law 0103 physical sciences Deposition (phase transition) Electrical and Electronic Engineering Thin film media_common 010302 applied physics business.industry 021001 nanoscience & nanotechnology Holographic interferometry Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials sense organs 0210 nano-technology business Science technology and society |
| Zdroj: | Optics & Laser Technology. 88:194-197 |
| ISSN: | 0030-3992 |
| DOI: | 10.1016/j.optlastec.2016.09.017 |
| Popis: | In this paper, we have reported the optical non destructive technique, which uses double exposure digital holographic interferometry (DEDHI) together with simple mathematical interpretation, which instantly situates to the thickness of thin films, deposited mass, stress to substrate and fringe width for different deposition times. Here, the stainless steel substrate was exposed for different intervals of time. It is observed that the fringe width, stress to substrate changes with changing the time of deposition. This effect is due to the increase in thickness of CdXZn1−XS (X=0.3) thin films. Thus, holographic studies show sensitivity to deposition time and concentrations of solution. |
| Databáze: | OpenAIRE |
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