Two-Layer Mutiple Trapping Model for Universal Current Transients in Molecularly Doped Polymers
| Autor: | David H. Dunlap, Vladimir Saenko, Evgenii D. Pozhidaev, David S. Weiss, L. B. Schein, Paul Ernest Parris, Andrey Tyutnev |
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| Rok vydání: | 2010 |
| Předmět: |
chemistry.chemical_classification
Exponential distribution Chemistry Doping Analytical chemistry Charge (physics) Trapping Polymer Molecular physics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Micrometre General Energy Transient (oscillation) Physical and Theoretical Chemistry Excitation |
| Zdroj: | The Journal of Physical Chemistry C. 114:9076-9088 |
| ISSN: | 1932-7455 1932-7447 |
| Popis: | The mechanism of charge transport in molecularly doped polymers has been the subject of much discussion over the years. In this paper, data obtained from a new experimental variant of the time-of-flight (TOF) technique, called TOF1a, are compared to the predictions of a two-layer multiple trapping model (MTM) with an exponential distribution of traps. In the recently introduced TOF1a experimental variant, the charge generation depth is varied continuously, from surface generation to bulk generation, by varying the energy of the electron-beam excitation source. This produces systematic changes in the shape of the current transient that can be compared to predictions of the two-layer MTM. In the model, one additional assumption is added to the homogeneous MTM, namely: that there exists a surface region, on the order of a micrometer thick, in which the trap distribution is identical to the bulk, but has a higher trap concentration. We find that the characteristic experimental features of an initial spike, a ... |
| Databáze: | OpenAIRE |
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