Effect of laser focus on ion production in the laser ion source for elemental analysis

Autor:	R. J. Conzemius, Shankai Zhao, Harry J. Svec, Robert S. Houk
Rok vydání:	1984
Předmět:	Active laser medium Ion beam business.industry Chemistry Ion gun Laser Beam parameter product Ion source law.invention Optics Ion beam deposition Physics::Plasma Physics law Physics::Atomic Physics Laser beam quality business Spectroscopy
Zdroj:	International Journal of Mass Spectrometry and Ion Processes. 61:277-292
ISSN:	0168-1176
DOI:	10.1016/0168-1176(84)87101-3
Popis:	Optimization of the laser ion source is best done via ion beam diagnostics rather than by visual focusing to the specimen surface or to a minimum diameter brightest plasma. Doubly charged ions signals are especially useful for the optimization of both the laser focus and the local laser power density level.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::880715848936492e74535e22d4d230de https://doi.org/10.1016/0168-1176(84)87101-3 Zobrazit plný text záznamu