Power-Aware Testing in the Era of IoT
| Autor: | Xiaoqing Wen |
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| Rok vydání: | 2022 |
| Zdroj: | 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT). |
| DOI: | 10.1109/icsict55466.2022.9963241 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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