Determination of mean square deviation of surface roughness in a planar gradient optical waveguide
| Autor: | Luis Cadena, Paola Leon, Nikolai Espinosa, Danny Sotomayor, Christian Vega, A. Osovitsky, J. Vila, Darwin Aguilar |
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| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Permittivity Materials science Scattering business.industry Diffusion Physics::Optics 020206 networking & telecommunications 02 engineering and technology 01 natural sciences Waveguide (optics) Molecular physics Wavelength Planar Optics 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Surface roughness business Root-mean-square deviation |
| Zdroj: | SPIE Proceedings. |
| ISSN: | 0277-786X |
| DOI: | 10.1117/12.2237983 |
| Popis: | Determining the mean square deviation σ of surface roughness and the imaginary part of permittivity n''of a planar gradient optical waveguides n(y)= n3+Δn'(y)+ in''(y) = n'(y)+ in''(y), using the integral waveguide scattering method. For experiment two samples are prepared. The first sample using exchange with silver ions and obtained a parabolic profile, subsequently the method of solid-state diffusion of lead oxide in the glass substrate provides a waveguide with a Gaussian distribution profile permittivity. In both cases, laser radiation is used with a wavelength of 0.6328 microns. |
| Databáze: | OpenAIRE |
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