| Autor: |
Shari Torka, Mark T. Bernius, Shaofu Wu, Simon Yeung, Beth M. Nichols, Steve Rozeveld, J. E. Gerbi, Buford I. Lemon, Randy Tesch, Robert T. Nilsson, Rebekah K. Feist, Timm Richardson, Charlie Wood, Melissa Mushrush, Robert Paul Haley, Scott Sprague |
| Rok vydání: |
2008 |
| Předmět: |
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| Zdroj: |
2008 33rd IEEE Photovolatic Specialists Conference. |
| ISSN: |
0160-8371 |
| DOI: |
10.1109/pvsc.2008.4922579 |
| Popis: |
In our study, Shell Solar Industries (SSI) minimodules were subjected to dry heat (85°C), damp heat (85°C/100% RH), and anaerobic/aerobic 85°C water baths. After 168 hrs exposure to moisture-containing environments, the SSI power generation decreased by over 50% of that of the original state. Analytical characterization performed before and after the exposure identified degradation of the Al:ZnO and Mo layers as likely device failure routes. To elucidate the observed degradation mechanism, individual Al:ZnO and Mo films were sputtered onto borosilicate glass and exposed to both 85°C/100% RH and a room temperature water bath. After 24 hrs the resistivity and optical transmission of the Al:ZnO films increased significantly following both exposure methods. XPS surface analysis of the films revealed changes in the O to Zn bonding ratio suggesting film hydration may have occurred. In addition, after 48 hours by both exposure methods the Mo films corroded, and the film resistivities increased. Our results show Al:ZnO layer degradation limits the lifetime of CIGSS based PV devices, whereas Mo degradation is considered a non-lifetime-limiting failure. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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