New development of scanning-type microscope for two-dimensional hydrogen distribution using electron-stimulated desorption method
| Autor: | Masamichi Yoshimura, Ken'ichi Ishikawa, Kazuyuki Ueda |
|---|---|
| Rok vydání: | 1999 |
| Předmět: |
Microscope
Hydrogen Scanning electron microscope Chemistry Analytical chemistry chemistry.chemical_element Surfaces and Interfaces Condensed Matter Physics Surfaces Coatings and Films law.invention Field emission microscopy Field electron emission law Desorption Materials Chemistry Electron microscope Spectroscopy |
| Zdroj: | Surface Science. :244-248 |
| ISSN: | 0039-6028 |
| DOI: | 10.1016/s0039-6028(99)00453-7 |
| Popis: | Time-of-flight type electron-stimulated desorption (TOF-ESD) spectroscopy enables us to study hydrogen on solid surfaces with high sensitivity. An analyzer for two-dimensional hydrogen distribution has been developed for TOF-ESD using a thermal field emission (TFE) gun for scanning electron microscopy. The lateral resolution of analysis is less than 1 μm at the primary-electron energy of 800 eV. A lower electron energy (around 200 eV) is preferable for inducing the ion desorption. We have improved the TFE gun working at the low primary-electron energy (above 300 eV) and show several hydrogen images as results of the improvement. The lattice pattern of a copper mesh is clearly resolved even at the energy of 300 eV. In this paper, we also discuss the topographic effects that appeared in scanning ESD images. Roughness of 1.2 μm height affects the ESD yield of H + ions mainly due to preferential desorption in the direction of the surface normal. |
| Databáze: | OpenAIRE |
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