Exponential two step approach for Time Domain based Software Process Control

Autor: G. Krishna Mohan, R. Satya Prasad, S. Murali Mohan
Rok vydání: 2013
Předmět:
Zdroj: INTERNATIONAL JOURNAL OF COMPUTERS & TECHNOLOGY. 8:777-786
ISSN: 2277-3061
Popis: Software Reliability Growth Model is a mathematical model of how the software reliability improves as faults are detected and repaired. In this paper we propose a control mechanism based on the cumulative quantity between observations of time domain failure data using mean value function of Goel-Okumoto model, which is based on Non Homogenous Poisson Process. The model parameters are estimated by a two step approach. Software reliability process can be monitored efficiently by using Statistical Process Control. Control charts are widely used for process monitoring. It assists the software development team to identify failures and actions to be taken during software failure process and hence, assures better software reliability.Â
Databáze: OpenAIRE