Scene Matching With Feature Detection
| Autor: | J. F. Belsher, R. H. Kin, H. F. Williams |
|---|---|
| Rok vydání: | 1979 |
| Předmět: |
business.industry
Computer science Optical engineering Feature extraction ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION Image registration Image processing Feature (computer vision) Digital image processing Computer vision Artificial intelligence business Digital signal processing Feature detection (computer vision) |
| Zdroj: | SPIE Proceedings. |
| ISSN: | 0277-786X |
| DOI: | 10.1117/12.957494 |
| Popis: | The Rockwell Pattern Matcher (RPM) is a feature based image matcher which has been demonstrated on passive IR and active laser images. Edge features are extracted and used to match electro-optical images. Matches have been made to reference images at the same wavelength as well as with reference imagery at the optical wavelength. In addition, a technique using three dimensional edge references has been utilized to automatically compensate the effects of geometric distortions due to different perspectives. Recent advances in computing technology make it passible to perform the required digital processing for a variety of applications.© (1979) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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