Bridging the Gap between EPMA and AEM: The Performance of High Resolution Field-Emission Electron Microprobes in the Analysis of Geological Materials

Autor:	John T. Armstrong, Peter McSwiggen, Charles Nielsen
Rok vydání:	2013
Předmět:	Field electron emission Bridging (networking) Materials science High resolution Nanotechnology Electron microprobe Electron Geological materials Instrumentation
Zdroj:	Microscopy and Microanalysis. 19:1254-1255
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s143192761300826x
Popis:	Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::8774d3265b697fd11d951e16aa5d2f18 https://doi.org/10.1017/s143192761300826x Zobrazit plný text záznamu