Fan Out Package: Performance and Scalability Perspective

Autor: Young Mo Lee, Young-Tae Kwon, Yoonyoung Bae, Seong-Wook Choi, Sang-Don Lee, Yeo Yong Woon, Yong Ho Kwon, Young June Park, Eung Ju Lee, Nam Chul Kim, Jong Heon Kim, Yoon Mook Park, Jun Kyu Lee
Rok vydání: 2018
Předmět:
Zdroj: 2018 IEEE 68th Electronic Components and Technology Conference (ECTC).
DOI: 10.1109/ectc.2018.00184
Popis: Fan Out Wafer Level Package (FOWLP) and Panel Level Package (PLP) have been introduced as cost-performance-form factor alternatives conventional packages. This paper shows the enhanced features and performance of FOWLP for high frequency automotive ADAS applications, fingerprint sensors and medical applications. Small form factor (
Databáze: OpenAIRE