Influence of structural defects on lattice parameter and measured composition of Hg1−xCdxTe epilayers

Autor:	E. Lakin, A. Sher, Emil Zolotoyabko, Gad Bahir, N. Mainzer, Alex Berner
Rok vydání:	1999
Předmět:	Inorganic Chemistry Lattice constant Scanning electron microscope Chemistry X-ray crystallography Materials Chemistry Energy-dispersive X-ray spectroscopy Analytical chemistry Infrared spectroscopy Condensed Matter Physics Spectroscopy Crystallographic defect Solid solution
Zdroj:	Journal of Crystal Growth. 197:542-546
ISSN:	0022-0248
DOI:	10.1016/s0022-0248(98)00748-9
Popis:	Structural and compositional parameters of the Hg 1-x Cd x Te layers grown by metal-organic vapor deposition on (2 1 1)-oriented CdTe substrates were investigated by high-resolution X-ray diffraction, high-resolution scanning electron microscopy, energy dispersive spectroscopy in scanning electron microscopy and Fourier transform infra-red spectroscopy in a transmission mode. Divergence in Cd concentrations, obtained by different methods, is explained in terms of extended defects which cause lattice swelling of the Hg 1-x Cd x Te matrix. Strong correlation between defect density and lattice swelling was established by absolute measurements of lattice parameters (Bond method) and by direct defect imaging. It is proposed to use high-resolution Bond technique for nondestructive monitoring of the layer quality.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::8716f983decb6dd7efe2f56c40184201 https://doi.org/10.1016/s0022-0248(98)00748-9 Zobrazit plný text záznamu Full Text from ScienceDirect