A new, optical‐lever based atomic force microscope
| Autor: | Ratnesh Lal, Stuart C. Feinstein, F. Yashar, G. Gurley, Virgil B. Elings, D. Grigg, Paul K. Hansma, Craig Prater, Barney Drake |
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| Rok vydání: | 1994 |
| Předmět: |
Materials science
Microscope Atomic de Broglie microscope business.industry General Physics and Astronomy Atomic force acoustic microscopy Conductive atomic force microscopy Local oxidation nanolithography law.invention Optics law Microscopy Magnetic force microscope business Non-contact atomic force microscopy |
| Zdroj: | Journal of Applied Physics. 76:796-799 |
| ISSN: | 1089-7550 0021-8979 |
| DOI: | 10.1063/1.357751 |
| Popis: | A new optical‐lever based atomic force microscope is described in which the cantilever scans and is accurately tracked by a scanning focused spot. It can operate at forces below one nanoNewton over image areas greater than 100 μ×100 μ. It can be combined with optical microscopes of high numerical aperture and operated with the sample and cantilever in fluids. As examples of its applications, images of living cells in Petri dishes and a 6 in. (15.24 mm) silicon wafer are included. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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