Parametric modelling of the permittivity of dielectric materials
Autor: | T. Van den Broeck, L. Peirlinckx, Patrick Guillaume |
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Rok vydání: | 2002 |
Předmět: | |
Zdroj: | Quality Measurement: The Indispensable Bridge between Theory and Reality (No Measurements? No Science! Joint Conference - 1996: IEEE Instrumentation and Measurement Technology Conference and IMEKO Technical Committee 7. Conference Proceedings. |
DOI: | 10.1109/imtc.1996.507309 |
Popis: | In this paper a new method is proposed for measuring the complex permittivity of dielectric materials based on a parametric model and the use of a maximum likelihood estimator. |
Databáze: | OpenAIRE |
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