Parametric modelling of the permittivity of dielectric materials

Autor: T. Van den Broeck, L. Peirlinckx, Patrick Guillaume
Rok vydání: 2002
Předmět:
Zdroj: Quality Measurement: The Indispensable Bridge between Theory and Reality (No Measurements? No Science! Joint Conference - 1996: IEEE Instrumentation and Measurement Technology Conference and IMEKO Technical Committee 7. Conference Proceedings.
DOI: 10.1109/imtc.1996.507309
Popis: In this paper a new method is proposed for measuring the complex permittivity of dielectric materials based on a parametric model and the use of a maximum likelihood estimator.
Databáze: OpenAIRE