Improving Cell-Aware Test for Intra-Cell Short Defects

Autor:	Dong-Zhen Lee, Ying-Yen Chen, Kai-Chiang Wu, Mango C.-T. Chao
Rok vydání:	2022
Zdroj:	2022 Design, Automation & Test in Europe Conference & Exhibition (DATE).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::86ce0213ebdbc89555818a687fcba2be https://doi.org/10.23919/date54114.2022.9774502 Zobrazit plný text záznamu