Digital Thickness Measurement of a Transparent Plastic Orthodontic Device
| Autor: | Sung-Han Rhim, Yoon-Hwan Kim |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
Measurement method
050402 sociology Materials science Scanning electron microscope business.industry 05 social sciences General Physics and Astronomy 030206 dentistry Transparency (human–computer interaction) Optical scanning 03 medical and health sciences 0302 clinical medicine Optics 0504 sociology Calibration business |
| Zdroj: | Journal of the Korean Physical Society. 72:1129-1132 |
| ISSN: | 1976-8524 0374-4884 |
| DOI: | 10.3938/jkps.72.1129 |
| Popis: | A transparent orthodontic device is used to move the teeth to the final calibration position to form a proper set of teeth. Because the uniform thickness of the device plays an important role in tooth positioning, the accuracy of the device’s thickness profile is important for effective orthodontic treatment. However, due to the complexity of the device’s geometry and the transparency of the device’s material, measuring the complete thickness profile has been difficult. In the present study, a new optical scanning method to measure the thickness profile of transparent plastic orthodontic devices is proposed and evaluated by using scanning electron microscopy (SEM). The error of the new measurement method is less than ±18 μm. The new method can be used to measure the thickness of non-specific, multi-curved, transparent orthodontic devices. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full text from SpringerLink