Layout-Dependent Vertical and In-Plane Leakage Current Reduction of Organic Thin-Film Transistors by Layer Contact Restriction
| Autor: | Kunihiro Oshima, Kazunori Kuribara, Takashi Sato |
|---|---|
| Rok vydání: | 2022 |
| Zdroj: | 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS). |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|