A SIMS and XPS study about ions influence on electrodeposited PbO2 films
| Autor: | Eugenio Tondello, Monica Fabrizio, Cesare Pagura, A.B Velichenko, Lidia Armelao, R Amadelli, Sergio Daolio |
|---|---|
| Rok vydání: | 1999 |
| Předmět: |
Doping
Oxide Analytical chemistry General Physics and Astronomy chemistry.chemical_element Lead dioxide Surfaces and Interfaces General Chemistry Condensed Matter Physics Oxygen Surfaces Coatings and Films Ion Metal chemistry.chemical_compound chemistry X-ray photoelectron spectroscopy visual_art visual_art.visual_art_medium Lead oxide |
| Zdroj: | Applied Surface Science. 142:200-203 |
| ISSN: | 0169-4332 |
| DOI: | 10.1016/s0169-4332(98)00707-7 |
| Popis: | XPS and SIMS investigation is presented on doped PbO 2 electrodeposited on Ti under conditions in which the beta form of the oxide largely prevails. Complementary results obtained by XPS and SIMS analyses indicate that the doping species markedly affect the oxygen species accumulation on the oxide surface. In particular, metal cations added to electrodeposition bath are found to influence the F − incorporation in the surface region of PbO 2 even if these foreign species are not detected in the coatings. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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