Enhanced a-Si/CsI-based flat-panel x-ray detector for mammography
| Autor: | Paul R. Granfors, Jeffrey Jon Shaw, Ching-Yeu Wei, Douglas Albagli |
|---|---|
| Rok vydání: | 2004 |
| Předmět: |
Amorphous silicon
Digital mammography Materials science Silicon Physics::Instrumentation and Detectors business.industry Detector X-ray detector chemistry.chemical_element Scintillator Flat panel detector Detective quantum efficiency chemistry.chemical_compound chemistry Electronic engineering Optoelectronics business |
| Zdroj: | SPIE Proceedings. |
| ISSN: | 0277-786X |
| DOI: | 10.1117/12.539141 |
| Popis: | The GE Senographe 2000D, the first full field digital mammography system based on amorphous silicon (a-Si) flat panel arrays and a cesium iodide (CsI) scintillator, has been in clinical use for over five years. One of the major advantages of this technology platform over competing platforms is the inherent flexibility of the design. Specifically, it is possible to optimize the x-ray conversion layer (scintillator) independently of the light conversion layer (panel) and vice versa. This is illustrated by a new detector utilizing the same amorphous silicon (a-Si) flat panel design, but an optimized scintillator layer, which provides up to 15% higher DQE than the existing detector. By utilizing the existing flat panel with an optimized scintillator layer, it is possible to significantly boost performance without changes to the panel design. Future enhancements to both the panel and scintillator will raise the DQE at zero frequency to more than 80%. The a-Si/CsI platform is especially well suited to advanced applications utilizing very low doses. |
| Databáze: | OpenAIRE |
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