Novel ion optics for secondary ion suppression in sputter initiated laser post-ionisation
| Autor: | R. Jennings, Kenneth W. D. Ledingham, C.J. McLean, P.T. McCombes, Ravi P. Singhal |
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| Rok vydání: | 1991 |
| Předmět: |
Nuclear and High Energy Physics
Chemistry business.industry Ion suppression in liquid chromatography–mass spectrometry Laser Mass spectrometry law.invention Ion Secondary ion mass spectrometry Ion beam deposition Optics Physics::Plasma Physics law Sputtering Ionization Atomic physics business Instrumentation |
| Zdroj: | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 62:285-288 |
| ISSN: | 0168-583X |
| DOI: | 10.1016/0168-583x(91)95912-w |
| Popis: | A novel ion optics arrangement has been designed to suppress secondary ion (SIMS) detection in a sputter initiated resonant post-ionisation (SIRIS) time-of-flight mass spectrometer. The advantage over other techniques for ion suppression is its simplicity. It is likely that this technique is also applicable to a resonant post-ionisation system which is laser initiated. |
| Databáze: | OpenAIRE |
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