I/sub DD/ pulse response testing on analog and digital CMOS circuits

Autor:	Hema Ramamurthy, J.S. Beasley, M. DeYong, Jaime Ramirez-Angulo
Rok vydání:	2002
Předmět:	Engineering Fabrication Pulse response business.industry Electrical engineering Process (computing) Hardware_PERFORMANCEANDRELIABILITY Power (physics) CMOS Hardware_INTEGRATEDCIRCUITS Electronic engineering Transient (oscillation) business Electronic circuit Voltage
Zdroj:	ITC
DOI:	10.1109/test.1993.470641
Popis:	This paper presents a new method for detecting defect and fabrication variations in both digital and analog CMOS circuits by simultaneously pulsing the power supply rails and analyzing the temporal and/or the spectral characteristics of the resulting transient rail currents. The method presented has a distinct advantage over other forms of i/sub DD/ testing because it requires a single test vector to excite and expose the presence of a defect or irregular fabrication process condition. This paper presents data from simulations and defective IC's supporting this technique. >
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::864270f435743b6965691c1587aec7ca https://doi.org/10.1109/test.1993.470641 Zobrazit plný text záznamu