Simulation of atomic force microscopy image variations due to tip apex size: appearance of half spots
| Autor: | Akiyasu Hirotani, Momoji Kubo, Katsuyuki Tazawa, Masaharu Komiyama, Akira Miyamoto, Kazuya Tsujimichi |
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| Rok vydání: | 1996 |
| Předmět: |
Nanostructure
Spots business.industry Atomic force microscopy technology industry and agriculture Metals and Alloys Analytical chemistry chemistry.chemical_element Model system macromolecular substances Surfaces and Interfaces Conductive atomic force microscopy Copper diagnosis Surfaces Coatings and Films Electronic Optical and Magnetic Materials Apex (geometry) Optics chemistry biological sciences Materials Chemistry Surface structure Condensed Matter::Strongly Correlated Electrons business |
| Zdroj: | Thin Solid Films. :580-583 |
| ISSN: | 0040-6090 |
| DOI: | 10.1016/0040-6090(96)08714-7 |
| Popis: | Using a recently developed atomic force microscopy (AFM) simulator ACCESS (AFM simulation Code for Calculating and Evaluating Surface Structures), effects of tip apex size on AFM images were examined. A metal tip-metal sample system consisting of iron tip and copper sample was employed as a model system. Structures with half the surface periodicity, which have been observed in actual AFM measurements, were observed at certain tip apex registries. Conditions for their appearances were examined. |
| Databáze: | OpenAIRE |
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