Empirical model of effects of pressure and temperature on electrical contact resistance of metals
| Autor: | Bernie Riemer, S. Suresh Babu, Michael L. Santella, J.W. Cohron, Zhili Feng |
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| Rok vydání: | 2001 |
| Předmět: | |
| Zdroj: | Science and Technology of Welding and Joining. 6:126-132 |
| ISSN: | 1743-2936 1362-1718 |
| DOI: | 10.1179/136217101101538631 |
| Popis: | An important input property in the development of process models for resistance spot welding is electrical contact resistance. A model for the pressure and temperature dependence of electrical contact resistance was developed from established concepts of contact resistance. The key to developing the desired relationship is determining surface roughness characteristics, which is experimentally problematic. To overcome this difficulty the electrical resistance of contacting interfaces was measured as a function of the pressure applied across the interfaces. Using known information about the temperature dependence of bulk resistivity and mechanical properties, a curve fitting procedure was used to establish the desired relationship of contact resistance to pressure and temperature. This empirical model agrees well with experimental measurements in the regime of low applied pressure. At high pressures, predictions underestimate contact resistance, and this was attributed to strain hardening of asperit... |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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