Advances in High Resolution CT and Dimensional Measuring

Autor:	O Brunke, K Brockdorf, D Moller-Gunderson
Rok vydání:	2008
Předmět:	Materials science Optics business.industry High resolution business Instrumentation
Zdroj:	Microscopy and Microanalysis. 14:1116-1117
ISSN:	1435-8115 1431-9276
Popis:	Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::85fda492a8b40174863c8fc1fad936fe https://doi.org/10.1017/s1431927608085656 Zobrazit plný text záznamu