XPS resolved surface states analysis of ZnO and Ni doped ZnO films for quantum well applications
| Autor: | Vinay Gupta, R. P. Tandon, Monika Tomar, Sheetal Dewan, Ashok K. Kapoor |
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| Rok vydání: | 2018 |
| Předmět: |
Materials science
business.industry Doping 02 engineering and technology 010402 general chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences 0104 chemical sciences Electronic Optical and Magnetic Materials Pulsed laser deposition Barrier layer X-ray photoelectron spectroscopy Optoelectronics Thin film 0210 nano-technology business Layer (electronics) Quantum well Surface states |
| Zdroj: | Ferroelectrics. 534:199-205 |
| ISSN: | 1563-5112 0015-0193 |
| DOI: | 10.1080/00150193.2018.1473678 |
| Popis: | ZnO and Ni doped ZnO (NiZnO) thin films were fabricated on c-plane sapphire substrate using Pulsed Laser Deposition (PLD) Technique. The surface states of the deposited thin films were analyzed using X-Ray Photoelectron spectroscopy (XPS) technique. The Zn LMM Auger transitions during XPS were examined in detail to identify the doping induced structural transformations in ZnO films. Hall effect and UV-Visible spectroscopic measurements were carried out on the prepared samples to estimate the electronic and optical properties. The obtained results favor the utilization of NiZnO as active well layer and ZnO as barrier layer in NiZnO/ZnO based Quantum Well structure fabrication. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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