A High Precision Scanning Control System For A VUV Fourier Transform Spectrometer

Autor: Laurent Nahon, M. Vervloet, Denis Joyeux, D. Phalippou, François Polack, N. De Oliveira, J. C. Rodier
Rok vydání: 2007
Předmět:
Zdroj: AIP Conference Proceedings.
ISSN: 0094-243X
DOI: 10.1063/1.2436095
Popis: A VUV Fourier transform spectrometer based on a wavefront division interferometer has been built. Our ultimate goal is to provide a high resolution absorption spectrometer in the 140 – 40 nm range using the new third generation French synchrotron source Soleil as the background continuum. Here, we present the design and latest performance of the instrument scanning control system. It is based on multiple reflections of a monomode, frequency‐stabilized HeNe laser between two plane mirrors allowing the required sensitivity on the displacement of the interferometer mobile arm. The experimental results on the sampling precision show an rms error below 5 nm for a travel length of 7.5 mm.
Databáze: OpenAIRE