Characterization ofAIIIBVsuperlattices by means of synchrotron diffraction topography and high-resolution X-ray diffraction
| Autor: | Carsten Paulmann, Wojciech Wierzchowski, Wlodek Strupinski, Krzysztof Wieteska, Malgorzata Mozdzonek, M. Wesołowski, Jaroslaw Gaca, Marek Wojcik |
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| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Materials science business.industry Superlattice High resolution 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences General Biochemistry Genetics and Molecular Biology Characterization (materials science) Crystallography Optics 0103 physical sciences X-ray crystallography Synchrotron diffraction Diffraction topography 0210 nano-technology business |
| Zdroj: | Journal of Applied Crystallography. 50:1192-1199 |
| ISSN: | 1600-5767 |
| Popis: | New possibilities are presented for the characterization ofAIIIBVmixed superlattice compounds by the complementary use of synchrotron diffraction topography and rocking curves. In particular, using a synchrotron white beam and the section diffraction pattern of a 5 µm slit taken at a 10 cm film-to-crystal distance, it was possible to reproduce a set of stripes corresponding to interference fringes. These are analogous to the interference maxima revealed in high-resolution rocking curves, but are created by the changes in orientation of the planes inclined to the surface which are induced by unrelaxed strain. The section diffraction topographic method enabled examination of the sample homogeneity along the narrow intersecting beam. This was important in the case of the present sample containing a twin lamella in the InP substrate wafer. Both the section and projection Bragg case topographic methods enabled the crystallographic identification of the twin lamella. Another characteristic feature indicated in the section topography was the bending of the stripes corresponding to the superlattice peaks close to the boundaries of the twin lamella. The most probable interpretation of this phenomenon is an increase in the thickness of the deposited layers close to the lamella, together with possible changes in the chemical composition, leading to a decrease in the mean lattice parameter in the superlattice. |
| Databáze: | OpenAIRE |
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