DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value

Autor:	Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges Gielen
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering Computer Graphics and Computer-Aided Design Software
Zdroj:	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:4771-4781
ISSN:	1937-4151 0278-0070
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::8511cdd2c8c819b0d9f9514a71b4106c https://doi.org/10.1109/tcad.2021.3139311 Zobrazit plný text záznamu