Simulation and measurement of supply and substrate noise in mixed-signal ICs
| Autor: | S.K. Arunachalam, P. Birrer, K. Mayaram, Terri S. Fiez, Robert W. Shreeve, B.E. Owens, S. Adluri |
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| Rok vydání: | 2005 |
| Předmět: |
Noise temperature
Engineering Substrate coupling Noise measurement business.industry Mixed-signal integrated circuit Y-factor Hardware_PERFORMANCEANDRELIABILITY Computer Science::Emerging Technologies Noise generator Hardware_INTEGRATEDCIRCUITS Electronic engineering Image noise Flicker noise Electrical and Electronic Engineering business Hardware_LOGICDESIGN |
| Zdroj: | IEEE Journal of Solid-State Circuits. 40:382-391 |
| ISSN: | 0018-9200 |
| DOI: | 10.1109/jssc.2004.841039 |
| Popis: | Digital noise in mixed-signal circuits is characterized using a scalable macromodel for substrate noise coupling. The noise coupling obtained through simulations is verified with measured data from a digital noise generator and noise sensitive analog circuits fabricated in the 0.35-/spl mu/m heavily doped CMOS process. The simulations and measurements also demonstrate the effectiveness of including grounded guard rings and separating bulk and supply pins in digital circuits to reduce substrate coupling. |
| Databáze: | OpenAIRE |
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