Analysis of Intermittent Single-bit Failure on 10-nm node generation DRAM Devices

Autor:	Hyewon Seo, Taiuk Rim, Eunsun Lee, Sekyoung Jang, Kyosuk Chae, Jeonghoon Oh, Hyodong Ban, Jooyoung Lee
Rok vydání:	2023
Zdroj:	2023 IEEE International Reliability Physics Symposium (IRPS).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::84dc408462e10c7974cf8df54f545ee0 https://doi.org/10.1109/irps48203.2023.10117671 Zobrazit plný text záznamu