Analysis of Intermittent Single-bit Failure on 10-nm node generation DRAM Devices
Autor: | Hyewon Seo, Taiuk Rim, Eunsun Lee, Sekyoung Jang, Kyosuk Chae, Jeonghoon Oh, Hyodong Ban, Jooyoung Lee |
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Rok vydání: | 2023 |
Zdroj: | 2023 IEEE International Reliability Physics Symposium (IRPS). |
Databáze: | OpenAIRE |
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