Temperature Cycling Performance of Bi-doped Solder Ball Alloy on DRAM Module Form and Daisy-Chained Printed Circuit Board

Autor: Y. S. Zou, M. H. Chung, C. L. Gan, Jeremy Chen, Claire Hsu, Hem Takiar
Rok vydání: 2022
Zdroj: 2022 IEEE 24th Electronics Packaging Technology Conference (EPTC).
DOI: 10.1109/eptc56328.2022.10013228
Databáze: OpenAIRE